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Re: Platte kurz vor dem Ende?



Andreas Pakulat wrote:

> On 09.01.06 09:34:53, Bastian Venthur wrote:
>> hda: dma_intr: status=0x51 { DriveReady SeekComplete Error }
>> hda: dma_intr: error=0x40 { UncorrectableError }, LBAsect=3408921,
>> sector=3408919
>> ide: failed opcode was: unknown
>> end_request: I/O error, dev hda, sector 3408919
>> EXT3-fs error (device hda1): ext3_get_inode_loc: unable to read inode
>> block - inode=213891, block=426107
>> Remounting filesystem read-only
>> 
>> Ich frag jetzt mal ganz panisch: neigt sich das Leben der Platte seinem
>> Ende?
> 
> Gut moeglich.
> 
>> Wie kann man das überprüfen?
> 
> Fuer kaputte Sektoren hilft badblocks, fuer andere Probleme hilft meist
> SMART bei der Identifizierung (smartmontools installieren).

Ok ich habe jetzt einmal mit fsck die Platte (bzw. die erste Partition)
getestet. Leider ist fsck nicht sehr geschwätzig und ich weis anhand der
Ausgabe nicht, ob die Platte nun badblocks hat oder nicht:

------[fsck]------
root@box:~# fsck.ext3 -c /dev/hda1
e2fsck 1.34-WIP (21-May-2003)
Checking for bad blocks (read-only test): done                        
Pass 1: Checking inodes, blocks, and sizes
Pass 2: Checking directory structure
Pass 3: Checking directory connectivity
Pass 4: Checking reference counts
Pass 5: Checking group summary information

/: ***** FILE SYSTEM WAS MODIFIED *****
/: 187313/549440 files (6.0% non-contiguous), 826085/1098586 blocks
root@box:~# 
------[fsck]------

Smartmon hab ich auch angeworfen aber auch hier weis ich mit der Ausgabe
('Schuldigung fürs Zumüllen) nix anzufangen:

------[smartmon]------

smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     IC25N020ATCS04-0
Serial Number:    CSH206D9G9SUUF
Firmware Version: CA2OA71A
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   5
ATA Standard is:  ATA/ATAPI-5 T13 1321D revision 3
Local Time is:    Mon Jan  9 14:48:33 2006 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine
completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                 ( 645) seconds.
Offline data collection
capabilities:                    (0x1b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        No General Purpose Logging support.
Short self-test routine 
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  26) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED 
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   096   096   062    Pre-fail  Always      
-       524288
  2 Throughput_Performance  0x0005   100   100   040    Pre-fail  Offline     
-       0
  3 Spin_Up_Time            0x0007   117   117   033    Pre-fail  Always      
-       1
  4 Start_Stop_Count        0x0012   090   090   000    Old_age   Always      
-       16635
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always      
-       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always      
-       0
  8 Seek_Time_Performance   0x0005   100   100   040    Pre-fail  Offline     
-       0
  9 Power_On_Hours          0x0012   083   083   000    Old_age   Always      
-       7872
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always      
-       0
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always      
-       1941
191 G-Sense_Error_Rate      0x000a   095   095   000    Old_age   Always      
-       327688
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always      
-       93
193 Load_Cycle_Count        0x0012   057   057   000    Old_age   Always      
-       434023
194 Temperature_Celsius     0x0002   127   127   000    Old_age   Always      
-       43 (Lifetime Min/Max 12/62)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always      
-       20
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always      
-       2
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline     
-       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always      
-       0

SMART Error Log Version: 1
ATA Error Count: 2
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 7870 hours (327 days + 22 hours)
  When the command that caused the error occurred, the device was active or
idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 06 19 04 34 e0  Error: UNC 6 sectors at LBA = 0x00340419 = 3408921

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 17 04 34 e0 00      00:13:09.800  READ DMA
  ca 00 00 88 92 86 e0 00      00:13:09.800  WRITE DMA
  ca 00 00 88 91 86 e0 00      00:13:09.700  WRITE DMA
  ca 00 00 88 90 86 e0 00      00:13:09.700  WRITE DMA
  ca 00 00 88 8f 86 e0 00      00:13:09.700  WRITE DMA

Error 1 occurred at disk power-on lifetime: 7777 hours (324 days + 1 hours)
  When the command that caused the error occurred, the device was active or
idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 02 1d 04 34 e0  Error: UNC 2 sectors at LBA = 0x0034041d = 3408925

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 17 04 34 e0 00      00:08:13.900  READ DMA
  c8 00 08 3f 00 4c e0 00      00:08:13.900  READ DMA
  c8 00 08 ff 03 34 e0 00      00:08:13.800  READ DMA
  c8 00 08 47 00 4c e0 00      00:08:13.800  READ DMA
  c8 00 08 f7 e8 0b e0 00      00:08:13.800  READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging

------[smartmon]------


Kann jemand an den Ausgaben erkennen was der Platte passiert ist und was ihr
evtl. bevorsteht?

 
>> Falls das wichtig ist: es handelt sich um die Plate eines Acer-Notebooks
>> und seit mindestens drei Jahren hatte ich nie Probleme mit der Platte.
> 
> Naja, fuer so eine Notebookplatte die haeufig benutzt wird ist das keine
> schlechte Lebensdauer wuerde ich mal sagen wollen.

:( Für mich sind 3 Jahre gerade mal ein Jahr mehr als Garantie -- Ist das
Standard, das man von seinem Notebook keine längere Lebenserwartung
annehmen darf?


Schöne Grüße

Bastian




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