[Date Prev][Date Next] [Thread Prev][Thread Next] [Date Index] [Thread Index]

Possibly non-fatal smart errors



Hi all,

I have a disk which gives me the following smart output.
The stopped self-test is my bad.

What do you guys think? I would tend to say the drive is
OK, but 16 errors is a tad too much, imo.


Thanks,
Richard


PS: If the extended test comes up with anything bad, I
will throw it away, anyway.


=================================



smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family:     Seagate NL35 family
Device Model:     ST3400832NS
Serial Number:    3NF1CJFP
Firmware Version: 5.01
User Capacity:    400,087,375,360 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   7
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Apr 14 22:07:47 2009 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      ( 247)	Self-test routine in progress...
					70% of test remaining.
Total time to complete Offline
data collection: 		 ( 430) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 134) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   064   049   006    Pre-fail
Always       -       170828508
  3 Spin_Up_Time            0x0003   098   097   000    Pre-fail
Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age
Always       -       5
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail
Always       -       0
  7 Seek_Error_Rate         0x000f   074   060   030    Pre-fail
Always       -       29283841
  9 Power_On_Hours          0x0032   100   100   000    Old_age
Always       -       440
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail
Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age
Always       -       19
194 Temperature_Celsius     0x0022   046   049   000    Old_age
Always       -       46 (Lifetime Min/Max 0/21)
195 Hardware_ECC_Recovered  0x001a   064   048   000    Old_age
Always       -       170828508
197 Current_Pending_Sector  0x0012   100   100   000    Old_age
Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age
Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age
Always       -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age
Offline      -       0
202 TA_Increase_Count       0x0032   100   253   000    Old_age
Always       -       0

SMART Error Log Version: 1
ATA Error Count: 16 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 16 occurred at disk power-on lifetime: 20 hours (0 days + 20 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 01 6e 88 93 ee

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  37 ff 01 6e 88 93 ee 00      00:02:58.685  SET MAX ADDRESS EXT
  27 ff 00 6e 88 93 e0 00      00:02:58.684  READ NATIVE MAX ADDRESS EXT
  37 ff 00 6e 88 93 ee 00      00:02:58.656  SET MAX ADDRESS EXT
  27 ff 01 6e 88 93 e0 00      00:03:08.046  READ NATIVE MAX ADDRESS EXT
  37 ff 01 6e 88 93 ee 00      00:03:08.046  SET MAX ADDRESS EXT

Error 15 occurred at disk power-on lifetime: 20 hours (0 days + 20 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 01 6e 88 93 ee

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  37 ff 01 6e 88 93 ee 00      00:02:58.685  SET MAX ADDRESS EXT
  27 ff 00 6e 88 93 e0 00      00:02:58.684  READ NATIVE MAX ADDRESS EXT
  37 ff 00 6e 88 93 ee 00      00:02:58.656  SET MAX ADDRESS EXT
  27 ff 01 af 90 93 e0 00      00:02:58.656  READ NATIVE MAX ADDRESS EXT
  29 00 01 af 90 93 e0 00      00:02:58.209  READ MULTIPLE EXT

Error 14 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 01 6e 88 93 ee

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  37 ff 01 6e 88 93 ee 00      00:47:38.007  SET MAX ADDRESS EXT
  27 ff 00 6e 88 93 e0 00      00:47:37.979  READ NATIVE MAX ADDRESS EXT
  37 ff 00 6e 88 93 ee 00      00:47:47.368  SET MAX ADDRESS EXT
  27 ff 01 6e 88 93 e0 00      00:47:47.368  READ NATIVE MAX ADDRESS EXT
  37 ff 01 6e 88 93 ee 00      00:47:47.242  SET MAX ADDRESS EXT

Error 13 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 01 6e 88 93 ee

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  37 ff 01 6e 88 93 ee 00      00:47:38.007  SET MAX ADDRESS EXT
  27 ff 00 6e 88 93 e0 00      00:47:37.979  READ NATIVE MAX ADDRESS EXT
  37 ff 00 6e 88 93 ee 00      00:47:37.979  SET MAX ADDRESS EXT
  27 ff 01 af 90 93 e0 00      00:47:37.532  READ NATIVE MAX ADDRESS EXT
  29 00 01 af 90 93 e0 00      00:47:37.532  READ MULTIPLE EXT

Error 12 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 01 6e 88 93 ee

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  37 ff 01 6e 88 93 ee 00      00:44:40.973  SET MAX ADDRESS EXT
  27 ff 00 6e 88 93 e0 00      00:44:40.847  READ NATIVE MAX ADDRESS EXT
  37 ff 00 6e 88 93 ee 00      00:44:40.847  SET MAX ADDRESS EXT
  27 ff 01 6e 88 93 e0 00      00:44:40.700  READ NATIVE MAX ADDRESS EXT
  37 ff 01 6e 88 93 ee 00      00:44:40.698  SET MAX ADDRESS EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining
LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Aborted by host               90%       439         -
# 2  Extended offline    Self-test routine in progress 70%       440         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


Reply to: