Re: Problem compiling custom kernel on debian
Hi,
>> Posting the output of 'smartctl -a /dev/hda' (from smartmontools, insert
>> your hard drive device name) might help as well.
>>
The output from smatctl is fairly cryptic for me, posting it below:
========================================================
sudo smartctl -a /dev/hdc1
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SV4084H
Serial Number: 0274J1FR139181
Firmware Version: PM100-12
User Capacity: 40,822,161,408 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 4
ATA Standard is: ATA/ATAPI-4 T13 1153D revision 17
Local Time is: Tue Apr 21 21:37:59 2009 IST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 960) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 16) minutes.
SMART Attributes Data Structure revision number: 9
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000a 100 100 051 Old_age
Always - 210
4 Start_Stop_Count 0x0032 094 094 000 Old_age
Always - 6287
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000a 253 253 051 Old_age
Always - 0
8 Seek_Time_Performance 0x0024 253 253 000 Old_age
Offline - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age
Always - 2136356
12 Power_Cycle_Count 0x0032 096 096 000 Old_age
Always - 4064
197 Current_Pending_Sector 0x0032 253 253 010 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 253 253 010 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age
Always - 0
SMART Error Log Version: 1
Warning: ATA error count 238 inconsistent with error log pointer 5
ATA Error Count: 238 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 238 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 88 08 af 19 1c e0 8 sectors at LBA = 0x001c19af = 1841583
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 af 19 1c e0 00 00:07:19.000 READ DMA
ca 00 40 87 05 44 e0 00 00:07:19.000 WRITE DMA
ca 00 10 47 05 44 e0 00 00:07:19.000 WRITE DMA
ca 00 08 2f 05 44 e0 00 00:07:19.000 WRITE DMA
ca 00 20 07 05 44 e0 00 00:07:19.000 WRITE DMA
Error 237 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 88 08 af 19 1c e0 8 sectors at LBA = 0x001c19af = 1841583
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 af 19 1c e0 00 00:07:19.000 READ DMA
ca 00 08 47 95 38 e0 00 00:07:19.000 WRITE DMA
ca 00 08 af 02 38 e0 00 00:07:19.000 WRITE DMA
ca 00 00 af 01 38 e0 00 00:07:19.000 WRITE DMA
ca 00 18 8f 01 38 e0 00 00:07:19.000 WRITE DMA
Error 236 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 88 08 af 19 1c e0 8 sectors at LBA = 0x001c19af = 1841583
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 af 19 1c e0 00 00:07:19.000 READ DMA
ca 00 80 67 06 34 e0 00 00:07:19.000 WRITE DMA
ca 00 08 57 06 34 e0 00 00:07:19.000 WRITE DMA
ca 00 08 3f 06 34 e0 00 00:07:19.000 WRITE DMA
ca 00 10 27 06 34 e0 00 00:07:19.000 WRITE DMA
Error 235 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 88 08 af 19 1c e0 8 sectors at LBA = 0x001c19af = 1841583
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 af 19 1c e0 00 00:07:18.000 READ DMA
c8 00 08 af 19 1c e0 00 00:10:04.000 READ DMA
c8 00 08 17 5a ef e0 00 00:10:04.000 READ DMA
c8 00 08 c7 c2 bf e0 00 00:10:04.000 READ DMA
c8 00 08 0f 58 9d e0 00 00:10:04.000 READ DMA
Error 234 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 88 08 af 19 1c e0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 01 4f c2 e0 00 00:33:17.000 SMART READ LOG
b0 d1 01 01 4f c2 e0 00 00:33:17.000 SMART READ ATTRIBUTE
THRESHOLDS [OBS-4]
b0 d0 01 00 4f c2 e0 00 00:33:17.000 SMART READ DATA
b0 da 00 00 4f c2 e0 00 00:33:17.000 SMART RETURN STATUS
b0 da 00 00 4f c2 e0 00 00:33:17.000 SMART RETURN STATUS
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Device does not support Selective Self Tests/Logging
========================================================
Thanks in advance,
Regards,
Divick
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