[Date Prev][Date Next] [Thread Prev][Thread Next] [Date Index] [Thread Index]

Re: Problem compiling custom kernel on debian



Hi,

>> Posting the output of 'smartctl -a /dev/hda' (from smartmontools, insert
>> your hard drive device name) might help as well.
>>

The output from smatctl is fairly cryptic for me, posting it below:

========================================================
 sudo smartctl -a /dev/hdc1
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG SV4084H
Serial Number:    0274J1FR139181
Firmware Version: PM100-12
User Capacity:    40,822,161,408 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   4
ATA Standard is:  ATA/ATAPI-4 T13 1153D revision 17
Local Time is:    Tue Apr 21 21:37:59 2009 IST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever
					been run.
Total time to complete Offline
data collection: 		 ( 960) seconds.
Offline data collection
capabilities: 			 (0x1b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  16) minutes.

SMART Attributes Data Structure revision number: 9
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000a   100   100   051    Old_age
Always       -       210
  4 Start_Stop_Count        0x0032   094   094   000    Old_age
Always       -       6287
  5 Reallocated_Sector_Ct   0x0033   253   253   010    Pre-fail
Always       -       0
  7 Seek_Error_Rate         0x000a   253   253   051    Old_age
Always       -       0
  8 Seek_Time_Performance   0x0024   253   253   000    Old_age
Offline      -       0
  9 Power_On_Hours          0x0032   097   097   000    Old_age
Always       -       2136356
 12 Power_Cycle_Count       0x0032   096   096   000    Old_age
Always       -       4064
197 Current_Pending_Sector  0x0032   253   253   010    Old_age
Always       -       0
198 Offline_Uncorrectable   0x0030   253   253   010    Old_age
Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age
Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   051    Old_age
Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   051    Old_age
Always       -       0

SMART Error Log Version: 1
Warning: ATA error count 238 inconsistent with error log pointer 5

ATA Error Count: 238 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 238 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 88 08 af 19 1c e0   8 sectors at LBA = 0x001c19af = 1841583

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 af 19 1c e0 00      00:07:19.000  READ DMA
  ca 00 40 87 05 44 e0 00      00:07:19.000  WRITE DMA
  ca 00 10 47 05 44 e0 00      00:07:19.000  WRITE DMA
  ca 00 08 2f 05 44 e0 00      00:07:19.000  WRITE DMA
  ca 00 20 07 05 44 e0 00      00:07:19.000  WRITE DMA

Error 237 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 88 08 af 19 1c e0   8 sectors at LBA = 0x001c19af = 1841583

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 af 19 1c e0 00      00:07:19.000  READ DMA
  ca 00 08 47 95 38 e0 00      00:07:19.000  WRITE DMA
  ca 00 08 af 02 38 e0 00      00:07:19.000  WRITE DMA
  ca 00 00 af 01 38 e0 00      00:07:19.000  WRITE DMA
  ca 00 18 8f 01 38 e0 00      00:07:19.000  WRITE DMA

Error 236 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 88 08 af 19 1c e0   8 sectors at LBA = 0x001c19af = 1841583

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 af 19 1c e0 00      00:07:19.000  READ DMA
  ca 00 80 67 06 34 e0 00      00:07:19.000  WRITE DMA
  ca 00 08 57 06 34 e0 00      00:07:19.000  WRITE DMA
  ca 00 08 3f 06 34 e0 00      00:07:19.000  WRITE DMA
  ca 00 10 27 06 34 e0 00      00:07:19.000  WRITE DMA

Error 235 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 88 08 af 19 1c e0   8 sectors at LBA = 0x001c19af = 1841583

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 af 19 1c e0 00      00:07:18.000  READ DMA
  c8 00 08 af 19 1c e0 00      00:10:04.000  READ DMA
  c8 00 08 17 5a ef e0 00      00:10:04.000  READ DMA
  c8 00 08 c7 c2 bf e0 00      00:10:04.000  READ DMA
  c8 00 08 0f 58 9d e0 00      00:10:04.000  READ DMA

Error 234 occurred at disk power-on lifetime: 17802 hours (741 days + 18 hours)
  When the command that caused the error occurred, the device was
active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 88 08 af 19 1c e0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d5 01 01 4f c2 e0 00      00:33:17.000  SMART READ LOG
  b0 d1 01 01 4f c2 e0 00      00:33:17.000  SMART READ ATTRIBUTE
THRESHOLDS [OBS-4]
  b0 d0 01 00 4f c2 e0 00      00:33:17.000  SMART READ DATA
  b0 da 00 00 4f c2 e0 00      00:33:17.000  SMART RETURN STATUS
  b0 da 00 00 4f c2 e0 00      00:33:17.000  SMART RETURN STATUS

Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision number = 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

Device does not support Selective Self Tests/Logging
========================================================

Thanks in advance,
Regards,
Divick


Reply to: