Hallo zusammen, scheinbar macht sich eine Festplatte auf den Weg ins Nirvana. Zumindest meldet die Laufwerksverwaltung fehlerhafte Sektoren und seit gestern oder vorgestern auch ausstehende Sektoren. Ich erinnerte mich an dieses Posting: http://lists.debian.org/debian-user-german/2011/05/msg00352.html > Ich würd Folgendes probieren: > > - *Erstmal Backup!* > > Dann: > > - smartctl -a <Laufwerk> > vor-langem-selbsttest.log > > - smartctl -t long <Laufwerk> > > - Warten bis der Test durchgelaufen ist, kann einige Stunden dauern > > - smartctl -a <Laufwerk> > nach-langsam-selbsttest.log > > Wenn da keine Medienfehler auftreten: > > - die Dateisysteme prüfen und ggf. reparieren Backup läuft eh ständig, den ersten Test hab ich gemacht und der lange Test läuft gerade. Hier mal das Log vom ersten Test, was mir mal irgendwie so gar nix sagt. Kann mir da evtl. mal jemand was zu sagen? > smartctl 5.40 2010-07-12 r3124 [x86_64-unknown-linux-gnu] (local > build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net > > === START OF INFORMATION SECTION === > Model Family: Seagate Barracuda 7200.10 family > Device Model: ST3320820AS > Serial Number: 5QF1SBC4 > Firmware Version: 3.AAC > User Capacity: 320.072.933.376 bytes > Device is: In smartctl database [for details use: -P show] > ATA Version is: 7 > ATA Standard is: Exact ATA specification draft version not indicated > Local Time is: Fri Jun 10 11:07:34 2011 CEST > SMART support is: Available - device has SMART capability. > SMART support is: Enabled > > === START OF READ SMART DATA SECTION === > SMART overall-health self-assessment test result: PASSED > > General SMART Values: > Offline data collection status: (0x82) Offline data > collection activity was completed without error. > Auto Offline Data Collection: > Enabled. Self-test execution status: ( 113) The previous self-test completed having > the read element of the test > failed. Total time to complete Offline > data collection: ( 430) seconds. > Offline data collection > capabilities: (0x5b) SMART execute Offline > immediate. Auto Offline data collection on/off support. > Suspend Offline collection > upon new command. > Offline surface scan > supported. Self-test supported. > No Conveyance Self-test > supported. Selective Self-test supported. > SMART capabilities: (0x0003) Saves SMART data > before entering power-saving mode. > Supports SMART auto save > timer. Error logging capability: (0x01) Error logging supported. > General Purpose Logging > supported. Short self-test routine > recommended polling time: ( 1) minutes. > Extended self-test routine > recommended polling time: ( 115) minutes. > > SMART Attributes Data Structure revision number: 10 > Vendor Specific SMART Attributes with Thresholds: > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE > UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 117 091 006 Pre-fail Always - 167699590 > 3 Spin_Up_Time 0x0003 094 090 000 Pre-fail > Always - 0 4 Start_Stop_Count 0x0032 099 099 020 Old_age Always - 1587 > 5 Reallocated_Sector_Ct 0x0033 099 099 036 Pre-fail > Always - 56 7 Seek_Error_Rate 0x000f 083 060 030 Pre-fail Always - 227147718 > 9 Power_On_Hours 0x0032 093 093 000 Old_age > Always - 6951 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 > 12 Power_Cycle_Count 0x0032 099 099 020 Old_age > Always - 1615 187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 644 > 189 High_Fly_Writes 0x003a 001 001 000 Old_age > Always - 128 190 Airflow_Temperature_Cel 0x0022 063 052 045 Old_age Always - 37 (Lifetime Min/Max 35/39) > 194 Temperature_Celsius 0x0022 037 048 000 Old_age > Always - 37 (0 11 0 0) 195 Hardware_ECC_Recovered 0x001a 067 059 000 Old_age Always - 6069363 > 197 Current_Pending_Sector 0x0012 100 100 000 Old_age > Always - 1 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 1 > 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age > Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 > 202 Data_Address_Mark_Errs 0x0032 099 252 000 Old_age > Always - 1 > > SMART Error Log Version: 1 >> ATA Error Count: 646 (device log contains only the most recent five >> errors) > CR = Command Register [HEX] > FR = Features Register [HEX] > SC = Sector Count Register [HEX] > SN = Sector Number Register [HEX] > CL = Cylinder Low Register [HEX] > CH = Cylinder High Register [HEX] > DH = Device/Head Register [HEX] > DC = Device Command Register [HEX] > ER = Error register [HEX] > ST = Status register [HEX] > Powered_Up_Time is measured from power on, and printed as > DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, > SS=sec, and sss=millisec. It "wraps" after 49.710 days. > > Error 646 occurred at disk power-on lifetime: 6118 hours (254 days + > 22 hours) > When the command that caused the error occurred, the device was >active or idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 40 51 00 9a fe 48 e0 Error: UNC at LBA = 0x0048fe9a = 4783770 > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > 25 00 68 87 fe 48 e0 00 00:11:28.061 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:28.061 WRITE DMA EXT > 35 00 08 77 1b 60 e0 00 00:11:28.061 WRITE DMA EXT > 35 00 30 07 43 5f e0 00 00:11:26.076 WRITE DMA EXT > 25 00 01 00 00 00 e0 00 00:11:26.076 READ DMA EXT > > Error 645 occurred at disk power-on lifetime: 6118 hours (254 days + > 22 hours) > When the command that caused the error occurred, the device was >active or idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 40 51 00 9a fe 48 e0 Error: UNC at LBA = 0x0048fe9a = 4783770 > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > 25 00 68 87 fe 48 e0 00 00:11:28.061 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:28.061 WRITE DMA EXT > 35 00 08 3f 00 5e e0 00 00:11:28.061 WRITE DMA EXT > 25 00 68 87 fe 48 e0 00 00:11:26.076 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:26.076 WRITE DMA EXT > > Error 644 occurred at disk power-on lifetime: 6118 hours (254 days + > 22 hours) > When the command that caused the error occurred, the device was >active or idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 40 51 00 9a fe 48 e0 Error: UNC at LBA = 0x0048fe9a = 4783770 > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > 25 00 68 87 fe 48 e0 00 00:11:20.119 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:20.119 WRITE DMA EXT > 35 00 20 5f 3b 07 e0 00 00:11:20.118 WRITE DMA EXT > 25 00 68 87 fe 48 e0 00 00:11:26.076 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:26.076 WRITE DMA EXT > > Error 643 occurred at disk power-on lifetime: 6118 hours (254 days + > 22 hours) > When the command that caused the error occurred, the device was >active or idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 40 51 00 9a fe 48 e0 Error: UNC at LBA = 0x0048fe9a = 4783770 > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > 25 00 68 87 fe 48 e0 00 00:11:20.119 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:20.119 WRITE DMA EXT > ea 00 00 00 00 00 a0 00 00:11:20.118 FLUSH CACHE EXT > 25 00 01 2b ee e1 e0 00 00:11:18.150 READ DMA EXT > 25 00 68 87 fe 48 e0 00 00:11:18.149 READ DMA EXT > > Error 642 occurred at disk power-on lifetime: 6118 hours (254 days + > 22 hours) > When the command that caused the error occurred, the device was >active or idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 40 51 00 9a fe 48 e0 Error: UNC at LBA = 0x0048fe9a = 4783770 > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > 25 00 68 87 fe 48 e0 00 00:11:20.119 READ DMA EXT > 35 00 08 17 da 64 e0 00 00:11:20.119 WRITE DMA EXT > 35 00 08 47 74 62 e0 00 00:11:20.118 WRITE DMA EXT > 35 00 08 2f 00 5e e0 00 00:11:18.150 WRITE DMA EXT > 25 00 01 00 00 00 e0 00 00:11:18.149 READ DMA EXT > > SMART Self-test log structure revision number 1 > Num Test_Description Status Remaining > LifeTime(hours) LBA_of_first_error ># 1 Short offline Completed: read failure 10% >6788 21568941 > > SMART Selective self-test log data structure revision number 1 > SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS > 1 0 0 Not_testing > 2 0 0 Not_testing > 3 0 0 Not_testing > 4 0 0 Not_testing > 5 0 0 Not_testing > Selective self-test flags (0x0): > After scanning selected spans, do NOT read-scan remainder of disk. > If Selective self-test is pending on power-up, resume after 0 minute > delay. Vielen Dank und Grüsse Gregor
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