bonjour,
personellement j'ai jamais pu aller plus loin quand smartmontools me donne un result: FAILED au lieu de PASSED:
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
a ta place je changerai de disque direct !
Merci Pascal pour la commande que je ne connaissais pas...
Cela finit de me convaincre que le disque (magnétique) est en très mauvaise forme...
SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA.
smartctl -a /dev/sdb smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-41-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Hitachi HTS543232A7A384 Serial Number: E2P3121L09BVPP LU WWN Device Id: 5 000cca 706c443dd Firmware Version: ES2OA60W User Capacity: 320 072 933 376 bytes [320 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Wed Dec 10 11:41:45 2014 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 45) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 88) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 001 001 062 Pre-fail Always FAILING_NOW 4294963998 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 253 253 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 2811 5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 2419 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2787 191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 49 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 3618 194 Temperature_Celsius 0x0002 250 250 000 Old_age Always - 24 (Min/Max 8/46) 196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 2626 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 65535 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 65535 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 06 0a 00 00 00 Error: UNC 6 sectors at LBA = 0x0000000a = 10 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d0 08 08 00 00 40 00 02:06:30.340 READ DMA EXT 25 d0 08 00 00 00 40 00 02:06:29.595 READ DMA EXT 35 d0 08 00 00 00 40 00 02:05:21.906 WRITE DMA EXT 25 d0 08 08 00 00 40 00 02:05:18.083 READ DMA EXT 25 d0 08 00 00 00 40 00 02:05:17.183 READ DMA EXT Error 65534 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 06 0a 00 00 00 Error: UNC 6 sectors at LBA = 0x0000000a = 10 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d0 08 08 00 00 40 00 02:05:18.083 READ DMA EXT 25 d0 08 00 00 00 40 00 02:05:17.183 READ DMA EXT 25 d0 08 00 00 00 40 00 02:04:10.392 READ DMA EXT 25 d0 08 08 00 00 40 00 02:04:09.163 READ DMA EXT b0 d0 40 20 4f c2 00 00 02:04:09.159 SMART READ DATA Error 65533 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 16 0a 00 00 00 Error: UNC 22 sectors at LBA = 0x0000000a = 10 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d0 20 00 00 00 40 00 02:03:56.260 READ DMA EXT 25 d0 01 a8 ea 42 40 00 02:03:52.771 READ DMA EXT 25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT 25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT 25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT Error 65532 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 a8 ea 42 05 Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d0 01 a8 ea 42 40 00 02:03:52.771 READ DMA EXT 25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT 25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT 25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT b0 d0 08 00 4f c2 00 00 02:00:03.282 SMART READ DATA Error 65531 occurred at disk power-on lifetime: 2418 hours (100 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 a8 ea 42 05 Error: UNC 1 sectors at LBA = 0x0542eaa8 = 88271528 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 d0 01 a8 ea 42 40 00 02:03:49.269 READ DMA EXT 25 d0 20 00 00 00 40 00 02:03:43.858 READ DMA EXT 25 d0 08 00 00 00 40 00 02:03:41.319 READ DMA EXT b0 d0 08 00 4f c2 00 00 02:00:03.282 SMART READ DATA e0 d0 08 00 4f c2 00 00 01:58:36.278 STANDBY IMMEDIATE SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
Le 10/12/2014 11:01, Pascal Hambourg a écrit :
smartctl -a /dev/
--
Pierre Touzeau
----------------------------------------------------------
Chargé de mission / Préfecture de region Basse-Normandie
SGAR/rue Daniel HUET/14038 CAEN CEDEX/Tel: +33 231 306 306
pierre.touzeau@basse-normandie.pref.gouv.fr / Fax: ... 564
----------------------------------------------------------