Analyse von smartctl-Output: was heisst "Pre-fail", "Old_age", etc
Hi all
Wie analysiere ich den Output von smartctl? Auf was muss ich achten? Was
muss ich beim Monitoring parsen?
Unten der Output von einem Notebook. Stirbt meine Platte bald?
# smartctl -a /dev/sda
smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K100 series
Device Model: HTS541010G9SA00
Serial Number: MP2ZX0XLGKY7TS
Firmware Version: MBZOC60P
User Capacity: 100,030,242,816 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Wed Sep 24 18:48:22 2008 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 66) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail
Always - 0
2 Throughput_Performance 0x0005 106 100 040 Pre-fail
Offline - 4524
3 Spin_Up_Time 0x0007 253 100 033 Pre-fail
Always - 1
4 Start_Stop_Count 0x0012 100 100 000 Old_age
Always - 1086
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0005 122 100 040 Pre-fail
Offline - 39
9 Power_On_Hours 0x0012 088 088 000 Old_age
Always - 5372
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 746
191 G-Sense_Error_Rate 0x000a 100 097 000 Old_age Always
- 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always
- 13
193 Load_Cycle_Count 0x0012 068 068 000 Old_age Always
- 322952
194 Temperature_Celsius 0x0002 166 100 000 Old_age Always
- 33 (Lifetime Min/Max 19/45)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 916 hours (38 days + 4 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 38 f3 5a 60 Error: UNC 128 sectors at LBA = 0x005af338 =
5960504
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 38 f3 5a 60 00 00:01:02.900 READ DMA
c8 00 80 b8 f2 5a 60 00 00:01:02.900 READ DMA
c8 00 80 38 f2 5a 60 00 00:01:02.900 READ DMA
c8 00 80 b8 f1 5a 60 00 00:01:02.900 READ DMA
c8 00 08 18 90 40 60 00 00:01:02.900 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART
checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Sven
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