Re: badblock tres lent
Le 15/12/2017 à 09:39, Dominique Dumont a écrit :
> Que dit smartctl ?
Voir en pièce jointe.
smartctl 6.5 2016-01-24 r4214 [i686-linux-4.8.0-36-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" DT01ACA... Desktop HDD
Device Model: TOSHIBA DT01ACA100
Serial Number: X5ADYZHNS
LU WWN Device Id: 5 000039 fe1f02b85
Firmware Version: MS2OA750
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Dec 15 09:29:33 2017 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6925) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 116) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 1
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 77
3 Spin_Up_Time 0x0007 129 129 024 Pre-fail Always - 172 (Average 183)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 3519
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 2005
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 113 113 020 Pre-fail Offline - 35
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 5631
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 3496
192 Power-Off_Retract_Count 0x0032 098 098 000 Old_age Always - 3519
193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 3519
194 Temperature_Celsius 0x0002 200 200 000 Old_age Always - 30 (Min/Max 12/56)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 3693
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1342 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1342 occurred at disk power-on lifetime: 5606 hours (233 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 38 d6 3f 01 Error: UNC 8 sectors at LBA = 0x013fd638 = 20960824
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 38 d6 3f e1 00 18:22:02.877 READ DMA
25 00 08 68 68 f4 e0 00 18:22:02.861 READ DMA EXT
c8 00 08 40 d6 9a e1 00 18:22:02.861 READ DMA
c8 00 08 38 d6 9a e1 00 18:22:02.846 READ DMA
25 00 08 e8 3a 1d e0 00 18:22:02.828 READ DMA EXT
Error 1341 occurred at disk power-on lifetime: 5595 hours (233 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 f0 db 45 03 Error: UNC 8 sectors at LBA = 0x0345dbf0 = 54909936
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 f8 d9 45 e0 00 07:45:50.628 READ DMA EXT
25 00 00 f8 d7 45 e0 00 07:45:49.141 READ DMA EXT
25 00 90 68 d6 45 e0 00 07:45:48.690 READ DMA EXT
25 00 70 00 b3 44 e0 00 07:45:48.673 READ DMA EXT
25 00 00 00 b1 44 e0 00 07:45:43.343 READ DMA EXT
Error 1340 occurred at disk power-on lifetime: 5595 hours (233 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 18 40 37 43 03 Error: UNC 24 sectors at LBA = 0x03433740 = 54736704
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 58 36 43 e0 00 07:45:25.305 READ DMA EXT
25 00 00 58 34 43 e0 00 07:45:22.979 READ DMA EXT
25 00 00 58 32 43 e0 00 07:45:21.890 READ DMA EXT
25 00 00 58 30 43 e0 00 07:45:21.714 READ DMA EXT
25 00 00 58 2e 43 e0 00 07:45:17.621 READ DMA EXT
Error 1339 occurred at disk power-on lifetime: 5593 hours (233 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 d8 21 cd 05 Error: UNC at LBA = 0x05cd21d8 = 97329624
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 c8 d8 21 cd 40 00 05:14:06.009 READ FPDMA QUEUED
60 80 b8 58 e1 ce 40 00 05:14:06.009 READ FPDMA QUEUED
60 00 b0 d8 e2 ce 40 00 05:14:06.009 READ FPDMA QUEUED
27 00 00 00 00 00 e0 00 05:14:06.009 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 00 05:14:06.007 IDENTIFY DEVICE
Error 1338 occurred at disk power-on lifetime: 5593 hours (233 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 d8 21 cd 05 Error: UNC at LBA = 0x05cd21d8 = 97329624
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 90 d8 e2 ce 40 00 05:14:02.236 READ FPDMA QUEUED
60 80 88 58 e1 ce 40 00 05:13:48.130 READ FPDMA QUEUED
60 80 80 d8 21 cd 40 00 05:13:48.130 READ FPDMA QUEUED
60 00 78 d8 1f cd 40 00 05:13:46.751 READ FPDMA QUEUED
60 00 70 d8 1d cd 40 00 05:13:46.654 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Reply to: