Re: [PATCH] Support for "hardware burn-in" stage
Frans Pop <elendil@planet.nl> writes:
<...>
> The only moment such a split would make sense to me if a stress-test udeb
> would become a kind of wrapper around multiple hardware test tools, but IMO
> the split could always be done at that time.
I share this feeling.
The udeb is simple enough that we shouldn't need changes to it too
ofthen and _if_ we get more stress test tools we can do that split
then.
Personally I think we'll end up doing it since if we accept this udeb
we'll "open the door" for new ideas and people are creative enough to
propose new tools and ways to improve this tests.
Cheers,
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