print_req_error: I/O Error, dev sda, sector xx...
Hallo,
gleich beim starten nach Grub erhalte ich diese
Meldung."print_req_error: I/O Error, dev sda, sector xxxxx--
Bei jedem booten werden die Fehler angeblich in anderen sectoren gefunden.
Ein Test mit:
# smartctl -t long /dev/sda
bringt mir:
# smartctl --capabilities /dev/sda
offline data collection activity
was completed without error.
und ein:
# smartctl -a /dev/sda
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.19.0-2-amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Blue
Device Model: WDC WD5000AAKX-001CA0
Serial Number: WD-WCAYUE087328
LU WWN Device Id: 5 0014ee 2057ff840
Firmware Version: 15.01H15
User Capacity: 500.107.862.016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Mar 3 00:46:14 2019 WET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection:
Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test
has ever
been run.
Total time to complete Offline
data collection: ( 8100) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 82) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3037) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail
Always - 23
3 Spin_Up_Time 0x0027 142 141 021 Pre-fail
Always - 3900
4 Start_Stop_Count 0x0032 095 095 000 Old_age
Always - 5159
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail
Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age
Always - 0
9 Power_On_Hours 0x0032 061 061 000 Old_age
Always - 28522
10 Spin_Retry_Count 0x0032 100 100 000 Old_age
Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 095 095 000 Old_age
Always - 5157
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always
- 366
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always
- 4792
194 Temperature_Celsius 0x0022 111 090 000 Old_age Always
- 32
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always
- 129
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age
Offline - 0
SMART Error Log Version: 1
ATA Error Count: 22 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 22 occurred at disk power-on lifetime: 27385 hours (1141 days + 1
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 5a 7a e1 Error: UNC 8 sectors at LBA = 0x017a5ae8 = 24795880
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 e8 5a 7a e1 08 00:00:38.656 READ DMA
c8 00 08 d8 5a 7a e1 08 00:00:38.656 READ DMA
c8 00 08 d0 5a 7a e1 08 00:00:38.656 READ DMA
c8 00 08 e0 59 7a e1 08 00:00:38.655 READ DMA
c8 00 08 d0 59 7a e1 08 00:00:38.655 READ DMA
Error 21 occurred at disk power-on lifetime: 27276 hours (1136 days + 12
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 4f d5 77 e1 Error: UNC 8 sectors at LBA = 0x0177d54f = 24630607
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 48 d5 77 e1 08 02:23:27.881 READ DMA
c8 00 08 40 d5 77 e1 08 02:23:27.881 READ DMA
c8 00 08 38 d5 77 e1 08 02:23:27.881 READ DMA
c8 00 08 30 d5 77 e1 08 02:23:27.881 READ DMA
c8 00 08 28 d5 77 e1 08 02:23:27.881 READ DMA
Error 20 occurred at disk power-on lifetime: 27243 hours (1135 days + 3
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 08 d9 97 77 e1 Error: AMNF 8 sectors at LBA = 0x017797d9 =
24614873
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 d8 97 77 e1 08 00:22:28.660 READ DMA
c8 00 08 d0 97 77 e1 08 00:22:28.659 READ DMA
c8 00 08 c8 97 77 e1 08 00:22:28.659 READ DMA
c8 00 08 c0 97 77 e1 08 00:22:28.659 READ DMA
c8 00 08 b8 97 77 e1 08 00:22:28.659 READ DMA
Error 19 occurred at disk power-on lifetime: 27236 hours (1134 days + 20
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 7f 8d 77 e1 Error: UNC 8 sectors at LBA = 0x01778d7f = 24612223
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 78 8d 77 e1 08 00:00:35.848 READ DMA
c8 00 08 70 8d 77 e1 08 00:00:35.846 READ DMA
c8 00 08 68 8d 77 e1 08 00:00:35.845 READ DMA
c8 00 08 60 8d 77 e1 08 00:00:35.844 READ DMA
c8 00 08 58 8d 77 e1 08 00:00:35.844 READ DMA
Error 18 occurred at disk power-on lifetime: 27236 hours (1134 days + 20
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 7f 8d 77 e1 Error: UNC at LBA = 0x01778d7f = 24612223
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 80 8c 77 e1 08 00:00:34.117 READ DMA
c8 00 00 80 8b 77 e1 08 00:00:34.085 READ DMA
c8 00 f0 90 8a 77 e1 08 00:00:34.044 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 28518
-
# 2 Short offline Completed without error 00% 28516
-
# 3 Short offline Completed without error 00% 12670
-
# 4 Extended offline Completed without error 00% 2111
-
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Muss ich mir nun Sorgen machen?
--
Beste Grüße
Sigi
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